• DocumentCode
    792591
  • Title

    A 4H-SiC high-power-density VJFET as controlled current limiter

  • Author

    Tournier, Dominique ; Godignon, Philippe ; Montserrat, Joseph ; Planson, Dominique ; Raynaud, Christophe ; Chante, Jean Pierre ; De Palma, Jean-François ; Sarrus, Franck

  • Author_Institution
    Centro Nacional de Microelectron., Bellatera, Spain
  • Volume
    39
  • Issue
    5
  • fYear
    2003
  • Firstpage
    1508
  • Lastpage
    1513
  • Abstract
    Considering fault current limiters for serial protection, many structures exist, from regulation to other complex systems such as circuit breakers, mechanical switches, or more conventional fuses. Up to now, only a few semiconductor current limiter structures have been described in the literature. Although current-regulative diode components already exist, their voltage and current capabilities (VBR=100 V, Imax=10 mA), do not allow their use in power systems. This paper presents both simulation study and experimental results of a bidirectional current limiter structure based on a vertical SiC VJFET. The device was designed for serial protection in order to limit I2t value. Finite-element simulations were performed with ISE-TCAD software to design the device and evaluate its static electrical characteristics. Then, dynamic simulations were performed to underline current reduction ability and power losses adjustment by gate resistance value optimization. Finally, electrical characterization for a unidirectional and a bidirectional device were done up to 400 V. The measured specific on resistance RON is in the range of 176 mΩ·cm2. Limiting capabilities have also been measured for a bidirectional device made of two unidirectional devices connected head to tail. The highest breakdown voltage value in "current limiting state" was measured to be ∼810 V, corresponding to a high power density of 140 kW/cm2.
  • Keywords
    current limiters; digital simulation; electric resistance measurement; electronic engineering computing; finite element analysis; junction gate field effect transistors; losses; power system protection; semiconductor device models; semiconductor materials; silicon compounds; 10 mA; 100 V; 240 V; 400 V; 4H-SiC high-power-density VJFET; 5 W; 810 V; I2t value limiting; ISE-TCAD software; SiC; bidirectional current limiter structure; breakdown voltage value; circuit breakers; controlled current limiter; current limiting state; current reduction ability; current-regulative diode components; dynamic simulations; finite-element simulations; fuses; gate resistance value optimization; high power density; mechanical switches; power losses adjustment; power systems; semiconductor current limiter structures; serial protection; specific on resistance measurement; static electrical characteristics; unidirectional device; vertical SiC VJFET; Circuit breakers; Current limiters; Electric resistance; Electrical resistance measurement; Fault current limiters; Fuses; Power system protection; Power system simulation; Switches; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2003.816465
  • Filename
    1233615