• DocumentCode
    792979
  • Title

    Evaluation of High Stability Secondary Emission Monitors

  • Author

    deParry, T. ; Ratner, L.G.

  • Author_Institution
    Argonne National Laboratory Argonne, Illinois
  • Volume
    16
  • Issue
    3
  • fYear
    1969
  • fDate
    6/1/1969 12:00:00 AM
  • Firstpage
    923
  • Lastpage
    926
  • Abstract
    A stable, remotely operated low scattering (?? = 0.246 mrad) secondary emission monitor (SEM) which was developed at Argonne National Laboratory (ANL) is described. Experimental results for secondary yield vs. energy of incident protons of 3.6 GeV/c to 12.33 GeV/c indicate that the yield increase is about 0.03%/GeV/c/A1 surface. Theoretical yield increase in the same energy range is about 0.02%/GeV/c/A1 surface. The overall yield/proton/A1 surface as observed at ANL increases from 2.7%/A1 surface at 3.6 GeV/c to 2.96%/A1 surface at 12.33 GeV/c.
  • Keywords
    Circuits; Electrodes; Laboratories; Particle beams; Protons; Remote monitoring; Scattering; Stability; Switches; Synchrotrons;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1969.4325403
  • Filename
    4325403
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=792979