DocumentCode
793378
Title
An electrical model with junction temperature for light-emitting diodes and the impact on conversion efficiency
Author
Park, Jeong ; Lee, Chin C.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA, USA
Volume
26
Issue
5
fYear
2005
fDate
5/1/2005 12:00:00 AM
Firstpage
308
Lastpage
310
Abstract
We present an electrical model for quantum-well light-emitting diodes (LEDs) with a current-spreading layer. The LEDs studied have a multiquantum well (MQW) between p-GaN and the n-GaN grown on sapphire. The model consists of a diode connected with a series resistor resulting from the combined resistance of the p-n junction, contacts, and current spreader. Based upon this model, the I-V curve of the diode itself without the series resistance is extracted from the measured LED I-V curve. The model also includes an empirical diode current equation which was sought by matching the extracted I-V curve. In the seeking process, junction temperature (Tj) rather than case temperature (Tc) was used in the equation. The diode model allows one to calculate the reduction on conversion efficiency caused by the series resistor. Results show that the current-spreading layer causes 20% of the efficiency reduction at Tj=107°C.
Keywords
light emitting diodes; p-n junctions; quantum wells; thermal analysis; GaN; case temperature; conversion efficiency; current-spreading layer; electrical model; junction temperature; light-emitting diodes; multiquantum well; p-n junction; sapphire; thermal analysis; Contact resistance; Electric resistance; Electrical resistance measurement; Equations; Light emitting diodes; P-n junctions; Quantum well devices; Quantum wells; Resistors; Temperature; Conversion efficiency; GaN; electrical model; junction temperature; light-emitting diodes (LEDs); thermal analysis;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2005.847407
Filename
1425691
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