• DocumentCode
    793378
  • Title

    An electrical model with junction temperature for light-emitting diodes and the impact on conversion efficiency

  • Author

    Park, Jeong ; Lee, Chin C.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA, USA
  • Volume
    26
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    308
  • Lastpage
    310
  • Abstract
    We present an electrical model for quantum-well light-emitting diodes (LEDs) with a current-spreading layer. The LEDs studied have a multiquantum well (MQW) between p-GaN and the n-GaN grown on sapphire. The model consists of a diode connected with a series resistor resulting from the combined resistance of the p-n junction, contacts, and current spreader. Based upon this model, the I-V curve of the diode itself without the series resistance is extracted from the measured LED I-V curve. The model also includes an empirical diode current equation which was sought by matching the extracted I-V curve. In the seeking process, junction temperature (Tj) rather than case temperature (Tc) was used in the equation. The diode model allows one to calculate the reduction on conversion efficiency caused by the series resistor. Results show that the current-spreading layer causes 20% of the efficiency reduction at Tj=107°C.
  • Keywords
    light emitting diodes; p-n junctions; quantum wells; thermal analysis; GaN; case temperature; conversion efficiency; current-spreading layer; electrical model; junction temperature; light-emitting diodes; multiquantum well; p-n junction; sapphire; thermal analysis; Contact resistance; Electric resistance; Electrical resistance measurement; Equations; Light emitting diodes; P-n junctions; Quantum well devices; Quantum wells; Resistors; Temperature; Conversion efficiency; GaN; electrical model; junction temperature; light-emitting diodes (LEDs); thermal analysis;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2005.847407
  • Filename
    1425691