DocumentCode :
793696
Title :
Impact of low-temperature buffer layers on nitride-based optoelectronics
Author :
Amano, Hiroshi ; Kamiyama, Satoshi ; Akasaki, Isamu
Author_Institution :
Dept. of Mater. Sci. & Eng., Meijo Univ., Nagoya, Japan
Volume :
90
Issue :
6
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
1015
Lastpage :
1021
Abstract :
A historical overview and recent trends in the research and development of nitride-based light emitters are presented. The growth of GaN using a low-temperature-deposited buffer layer conductivity control, and the use of GaInN alloys, by which nonradiative recombination centers in nitrides are screened, have been employed to fabricate high-efficiency blue and green light-emitting diodes. Today, luminous flux efficiency of up to 50 lm/W at a specific wavelength is available. Electrical pumping has realized commercial laser diodes in the violet and blue regions. Several milestones in the realization of these achievements are reviewed. Future prospects of the nitride-based light emitters are also discussed.
Keywords :
III-V semiconductors; MOCVD; aluminium compounds; electroluminescence; gallium compounds; light emitting diodes; reviews; semiconductor lasers; wide band gap semiconductors; AlGaN-GaN; AlGaN/GaN system; EL spectrum; GaInN alloys; GaN growth; III-nitride based optoelectronics; MOVPE growth; UV LED; blue region; conductivity control; electrical pumping; high-efficiency blue light-emitting diodes; high-efficiency green light-emitting diodes; historical overview; laser diodes; low-temperature buffer layers; luminous flux efficiency; nitride-based light emitters; nonradiative recombination centers; violet region; Buffer layers; Conductivity; Crystallization; Epitaxial growth; Epitaxial layers; Gallium nitride; Impurities; Light emitting diodes; Reproducibility of results; Substrates;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2002.1021566
Filename :
1021566
Link To Document :
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