• DocumentCode
    793731
  • Title

    Switching noise and shoot-through current reduction techniques for switched-capacitor voltage doubler

  • Author

    Lee, Hoi ; Mok, Philip K T

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
  • Volume
    40
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    1136
  • Lastpage
    1146
  • Abstract
    Switching noise and shoot-through current reduction techniques for switched-capacitor voltage doublers based on cross-coupled structure are presented. The intuitive analysis of the shoot-through current and switching noise generation processes in the doubler is first reported. Break-before-make mechanism is adopted to minimize the shoot-through current, thereby greatly reducing the no-load supply current dissipation and improving the light-load power efficiency of the voltage doubler. In addition, by employing gate-slope reduction technique at the serial power transistor during turn-on, the switching noise of the voltage doubler is significantly lowered. Two voltage doublers with and without the proposed circuit techniques have been fabricated in a 0.6-μm CMOS process. Experimental results verify that the total supply current at no-load condition of the proposed voltage doubler is reduced by two fold and its switching noise is decreased by 2.5 times.
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; circuit noise; electric current; switched capacitor networks; voltage multipliers; 0.6 micron; CMOS process; charge pump; cross-coupled structure; dc-dc converter; fight-load power efficiency; gate-slope reduction technique; no-load supply current dissipation; serial power transistor; shoot-through current reduction; switched-capacitor power converter; switched-capacitor voltage doubler; switching noise generation process; Capacitors; Charge pumps; Circuit noise; Current supplies; MOSFETs; Noise generators; Noise reduction; Power transistors; Switching converters; Voltage; Break-before-make mechanism; charge pump; dc–dc converter; shoot-through current; switched-capacitor power converter; switching noise; voltage doubler;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2005.845978
  • Filename
    1425721