• DocumentCode
    793920
  • Title

    Dissipation in Solid-State Devices--The Magic of Il + N

  • Author

    Newell, William E.

  • Issue
    4
  • fYear
    1976
  • fDate
    7/1/1976 12:00:00 AM
  • Firstpage
    386
  • Lastpage
    396
  • Abstract
    The current capacity of a solid-state device, as ordinarily rated, varies widely depending on the current waveform, duty cycle, case temperature, etc. The underlying junction temperature limits should, however, be invariant.
  • Keywords
    Computer aided manufacturing; Impedance; Power electronics; Power system transients; Semiconductor diodes; Solid state circuits; Surges; Temperature dependence; Thyristors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.1976.349442
  • Filename
    4157896
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=793920