• DocumentCode
    794199
  • Title

    Design and Performance of an Integrated Circuit Flip Flop with Photocurrent Compensation

  • Author

    Aiken, J.G. ; Crabbe, J.S. ; Spence, H.W. ; Kinoshita, G. ; Phillips, H.

  • Author_Institution
    Texas Instruments Incorporated Dallas, Texas
  • Volume
    16
  • Issue
    6
  • fYear
    1969
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    The design and testing of a dielectrically isolated integrated circuit Set-Reset (RS) flip flop is described. The flip flops were fabricated with bipolar transistors having a primary photocurrent sensitivity of 3-5 × 10-11 mA/rad(Si)/s. The flip flops were capable of being switched on clock command during a 400 nsec electron beam pulse with a peak dose rate of 1.6 × 1011 rad(Si)/s.
  • Keywords
    Bipolar transistors; Circuit testing; Clocks; Dielectrics; Diodes; Instruments; Integrated circuit testing; Ionizing radiation; Photoconductivity; Radiation hardening;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1969.4325523
  • Filename
    4325523
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=794199