• DocumentCode
    794469
  • Title

    Identification of electric circuits described by ill-conditioned mathematical models

  • Author

    Adalev, Alexei S. ; Korovkin, Nikolay V. ; Hayakawa, Masashi

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Electro-Commun., Tokyo, Japan
  • Volume
    53
  • Issue
    1
  • fYear
    2006
  • Firstpage
    78
  • Lastpage
    91
  • Abstract
    This paper treats the problem of identification of a linear electric circuit described by an ill-conditioned mathematical model. The identification problem is considered as the problem of model parameters determination by means of processing experimental data measured for the objective circuit. Topological singularities (low-admittance cutsets and low-impedance loops) in a circuit are found to be origins of ill-conditionality of a circuit model. For more in-depth investigation the classification of electric circuits is made in respect to singularities position. It is shown that the first set of experimental data obtained for an ill-conditioned model is useless for getting the required solution of the identification problem. In this case a solution error amounts to a huge value that exponentially increases with growth in condition number of a model matrix. It is found that linear relations between model parameters can be determined in an ill-conditioned problem. Accuracy of these relations does not depend on condition number, but is defined only by measurement precision. An approach named as repeat measurements principle (RMP) and based on linear relations is suggested to solve an ill-conditioned identification problem. A new RMP-based algorithm of linear circuit identification is developed. The algorithm shows a high efficiency and allows us to determine model parameters accurate to measurement precision as applied to any type of reciprocal and nonreciprocal linear circuits.
  • Keywords
    analogue circuits; linear network synthesis; network topology; analog circuit fault diagnosis; analog circuit identification; electric circuit classification; electric circuits; ill-conditioned identification problem; ill-conditioned mathematical models; ill-conditioned matrix; linear circuit identification; linear electric circuit; linear relations; low-admittance cutsets; low-impedance loops; model parameters determination; nonreciprocal linear circuits; reciprocal linear circuit; repeat measurements principle; singularities position; topological singularities; Analog circuits; Data processing; Electrical engineering; Electromagnetic compatibility; Fault diagnosis; Linear circuits; Loss measurement; Mathematical model; Mathematics; Physics; Analog circuit fault diagnosis; analog circuit identification; ill-conditioned matrix; singular cutset; singular loop; stiff problem;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2005.854416
  • Filename
    1576888