The effect of Pd layer thickness on the magnetic and magneto-optical properties of Pd/(Pt/Co/Pt) modulated multilayers

Author

Xiao, Ying ; Xu, Jun-Hao ; Wittborn, Jesper ; Makino, Y. ; Rao, K.V. ; Lee, Zuo Yi

Author_Institution

Dept. of Condensed Matter Phys., R. Inst. of Technol., Stockholm, Sweden

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

3343

Lastpage

3345

Abstract

A series of Pd-t_Pd/(Pt-2 Å/Co-3 Å/Pt-2 Å) modulated multilayer films with Pd layer thickness t_Pd ranging from 3 to 12 Å have been deposited on oxidized Si substrates. SQUID magnetic and Kerr hysteresis measurements reveal that large magnetic moment and Kerr rotation is achieved in the multilayers with Pd layer thicknesses less than 6 Å. This result, and X-ray diffraction data, suggest that the Pd layer thickness strongly affects the magnitude of the induced magnetic moment and Kerr rotation as well as the sharpness of the interfaces of Pd/(Pt/Co/Pt) multilayers. A Kerr rotation of 0.3° is observed near 400 nm in the multilayer film with t_Pd of 6 Å. The multilayers with t_Pd of 6 to 12 Å exhibit perpendicular magnetic anisotropy energies

Keywords

Kerr magneto-optical effect; X-ray diffraction; cobalt; magnetic hysteresis; magnetic moments; magnetic multilayers; palladium; perpendicular magnetic anisotropy; platinum; 400 nm; Kerr rotation; Pd layer; Pd-Pt-Co-Pt; Pt/Co/Pt modulated multilayer films; SQUID magnetic hysteresis; X-ray diffraction; interface sharpness; magnetic moment; magnetic properties; magneto-optical properties; oxidized Si substrates; perpendicular magnetic anisotropy; Magnetic anisotropy; Magnetic films; Magnetic hysteresis; Magnetic moments; Magnetic multilayers; Perpendicular magnetic anisotropy; Rotation measurement; SQUIDs; Semiconductor films; Substrates;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490376

Filename

490376