• DocumentCode
    794579
  • Title

    Long-Term Stability Characteristics of Commonly Used Channel Electron Multipliers

  • Author

    Klettke, B.D. ; Krym, N.D. ; Wolber, W.G.

  • Author_Institution
    Bendix Research Laboratories Southfield, Michigan
  • Volume
    17
  • Issue
    1
  • fYear
    1970
  • Firstpage
    72
  • Lastpage
    80
  • Abstract
    The gains of seven units of a commonly used channel electron multiplier model have been observed as a function of total accumulated counts in a clean, ion-pumped vacuum station at 3 ?? 10-10 Torr. After decreasing by a factor of two to three during the first 5 ?? 107 counts of operation, all gains remained relatively constant until the channel multipliers had each accumulated about 1010 counts at which time a continual degradation began. A typical channel electron multiplier degraded from a gain of 1.25 ?? 108 at 1010 counts to 7.0 ?? 107 at 1.4 ?? 1011 total accumulated counts, The effects of gain fatigue on high count-rate capability, on resistance, and on the output pulse-height spectrum shape are also presented, Less extensive data showing the long-term stability characteristics of a newer model of channel multiplier with longer life are included.
  • Keywords
    Degradation; Electron emission; Electron multipliers; Electron tubes; Fatigue; Laboratories; Space vector pulse width modulation; Stability; Surface treatment; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1970.4325563
  • Filename
    4325563