• DocumentCode
    795276
  • Title

    GA-based system for critical points detection

  • Author

    Liatsis, P. ; Ooi, C. ; Goulermas, J.Y.

  • Author_Institution
    Sch. of Eng. & Math. Sci., City Univ., London
  • Volume
    42
  • Issue
    21
  • fYear
    2006
  • Firstpage
    1207
  • Lastpage
    1208
  • Abstract
    A GA-based algorithm for detection of dominant points in closed contours is presented. The proposed scheme aims to simultaneously optimise the number of detected critical points and the approximation error. A new error metric is proposed which takes into account information from the Chamfer image. The performance of the system is shown to be robust to changes in the position, orientation and size of the contour as well as the length of the chromosome
  • Keywords
    critical points; genetic algorithms; image processing; Chamfer image; approximation error; closed contours; critical points detection; genetic algorithm;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • Filename
    1715184