DocumentCode

796606

Title

The Long-Term Effects of Radiation on Complementary MOS Logic Networks

Author

Poch, W.J. ; Holmes-Siedle, A.G.

Author_Institution

RCA Astro-Electronics Division Princeton, N. J.

Volume

17

Issue

6

fYear

1970

Firstpage

33

Lastpage

40

Keywords

CMOS logic circuits; Failure analysis; Insulation; Inverters; Ionizing radiation; Logic devices; MOS devices; MOSFETs; Silicon; Threshold voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1970.4325764

Filename

4325764