DocumentCode
796710
Title
Component Vulnerability Analysis of Microcircuits
Author
Raymond, James P.
Author_Institution
Northrop Corporate Laboratories Hawthorne, California
Volume
17
Issue
6
fYear
1970
Firstpage
91
Lastpage
95
Keywords
Admittance; Application software; Circuits; Contracts; Degradation; Failure analysis; Ionizing radiation; Laboratories; Mathematical model; Semiconductor device measurement;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1970.4325772
Filename
4325772
Link To Document