• DocumentCode
    796852
  • Title

    Simulation of ultra-small GaAs MESFET using quantum moment equations

  • Author

    Zhou, Jing-Rong ; Ferry, David K.

  • Author_Institution
    Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
  • Volume
    39
  • Issue
    3
  • fYear
    1992
  • fDate
    3/1/1992 12:00:00 AM
  • Firstpage
    473
  • Lastpage
    478
  • Abstract
    Ultra-small MESFETs have characteristic lengths comparable to quantum lengths: wavelength, mean free path, etc. In a first attempt to incorporate these quantum lengths, the authors develop a model based upon a set of quantum moment equations obtained from the Wigner function equation-of-motion. Interesting time-dependent current oscillation behavior has been observed when a step voltage is applied to the initial steady state. The oscillation frequency is peaked around 500 GHz, which is related to the plasma response of the carriers in the channel. Quantum effects, such as barrier repulsion and penetration, have been demonstrated in the simulation. These effects modify the electron density distribution and current density distribution both in the channel and near the source. Modifications of the frequency spectrum of the oscillation current due to the quantum effects are obvious
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; oscillations; semiconductor device models; solid-state microwave devices; 500 GHz; GaAs; Wigner function equation-of-motion; barrier repulsion; characteristic lengths; current density distribution; current oscillation; electron density distribution; frequency spectrum; oscillation frequency; plasma response; quantum effects; quantum lengths; quantum moment equations; semiconductors; step voltage; ultra-small MESFETs; Electrons; Equations; Frequency; Gallium arsenide; MESFETs; Plasma density; Plasma simulation; Plasma sources; Steady-state; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.123465
  • Filename
    123465