DocumentCode
796967
Title
Electrical tree and deteriorated region in polyethylene
Author
Shimizu, N. ; Uchida, K. ; Rasikawan, S.
Author_Institution
Dept. of Electr. Eng., Nagoya Univ., Japan
Volume
27
Issue
3
fYear
1992
fDate
6/1/1992 12:00:00 AM
Firstpage
513
Lastpage
518
Abstract
In polyethylene subjected to high electric fields, a deteriorated region is formed before tree initiation. The chemical analysis of the deteriorated region by FT-IR and Raman spectroscopy showed that it contains excess carbonyl groups (C=O) and double bonds (C=C) compared to normal polyethylene. Scanning electron microscope observation found in the deteriorated region a number of voids with diameter <0.5 μm. The observation by transmission electron microscope revealed that the lamellar structure of polyethylene is destroyed in the deteriorated region. It was found that tree initiation voltages for AC ramp and positive impulse are increased after the formation of the deteriorated region. The change of polyethylene structure is considered to be responsible for the increase of treeing resistance. It is worth noticing that the formation of the deteriorated region has a possibility as a new way for voltage hardening of practical apparatus
Keywords
bonds (chemical); dielectric properties of solids; electric breakdown of solids; organic insulating materials; polymer structure; polymers; scanning electron microscope examination of materials; spectrochemical analysis; transmission electron microscope examination of materials; voids (solid); FTIR spectra; Raman spectroscopy; SEM; TEM; chemical analysis; deteriorated region; double bonds; excess carbonyl groups; high electric fields; lamellar structure; polyethylene; tree initiation voltages; treeing resistance; voids; voltage hardening; Chemical analysis; Electrodes; Erbium; Helium; Low voltage; Needles; Petrochemicals; Polyethylene; Scanning electron microscopy; Transmission electron microscopy;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/14.142714
Filename
142714
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