Effects of multiple impulse currents on the microstructure and electrical properties of metal-oxide varistors

Author

Sargent, R.A. ; Dunlop, G.L. ; Darveniza, M.

Author_Institution

Queensland Univ., St Lucia, Qld., Australia

Volume

27

Issue

3

fYear

1992

fDate

6/1/1992 12:00:00 AM

Firstpage

586

Lastpage

592

Abstract

The multiple impulse currents that are associated with a lightning ground flash have a stronger degradation effect on the electrical properties of metal oxide varistors than single pulses. It has been found that this degradation is associated with the formation of cracks extending between the contact surfaces of the devices which are filled with an amorphous material. These defects probably develop because of the formation of highly localized conduction paths during the application of the current pulses

Keywords

cracks; crystal microstructure; impulse testing; semiconductor device testing; transients; varistors; II-VI semiconductor; ZnO varistors; contact surfaces; electrical properties; formation of cracks; highly localized conduction paths; lightning ground flash; metal-oxide varistors; microstructure; multiple impulse currents; Absorption; Breakdown voltage; Circuit testing; Degradation; Electric variables; Insulation testing; Lightning; Microstructure; Varistors; Zinc oxide;

fLanguage

English

Journal_Title

Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

0018-9367

Type

jour

DOI

10.1109/14.142723

Filename

142723