• DocumentCode
    797168
  • Title

    A high-speed 16-kb GaAs SRAM of less than 5 ns using triple-level metal interconnection

  • Author

    Noda, Minoru ; Matsue, Shuichi ; Sakai, Masayuki ; Sumitani, Kouichi ; Nakano, Hirofumi ; Oku, Tomoki ; Makino, Hiroshi ; Nishitani, Kazuo ; Otsubo, Mutsuyuki

  • Author_Institution
    Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    39
  • Issue
    3
  • fYear
    1992
  • fDate
    3/1/1992 12:00:00 AM
  • Firstpage
    494
  • Lastpage
    499
  • Abstract
    The authors have realized 16-kb SRAMs with maximum address access time of less than 5 ns and typical power dissipation of less than 2 W at temperatures ranging from 25°C to 100°C. For the RAMs, they have developed a triple-level Au-based interconnection technology that reduces the wiring length and chip size of the SRAM so as to achieve high speed and high yield. Consequently, the wiring length and chip size are reduced to 69% and 58%, respectively, of those obtained by in previous work. The authors experimentally compared the delay time incurred by double-level interconnection and that by triple-level interconnection. This ratio is found to agree well with the simulated one by a model with distributed RC delay. After successfully suppressing Au hillock generation by lowering the process temperature, yield per wafer of 10% is obtained
  • Keywords
    III-V semiconductors; SRAM chips; VLSI; field effect integrated circuits; gallium arsenide; gold; metallisation; 16 kbit; 2 W; 25 to 100 C; 5 ns; Au hillock suppression; Au metallisation; GaAs; SRAMs; address access time; chip size; delay time; distributed RC delay; power dissipation; process temperature; semiconductors; temperatures; triple-level interconnection; triple-level metal interconnection; wiring length; yield per wafer; Capacitance; Delay effects; Delay estimation; Gallium arsenide; Integrated circuit interconnections; Laboratories; Random access memory; Research and development; Temperature distribution; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.123468
  • Filename
    123468