On Obtaining Maximum-Length Sequences for Accumulator-Based Serial TPG

Author

Kagaris, D. ; Karpodinis, P. ; Nikolos, D.

Author_Institution

Electr. & Comput. Eng. Dept., Southern Illinois Univ., Carbondale, IL

Volume

25

Issue

11

fYear

2006

Firstpage

2578

Lastpage

2586

Abstract

Arithmetic-function modules, which are available in many circuits, can be utilized to generate test patterns and compact test responses. An accumulator-based scheme along with a procedure to find maximum-length nonlinear sequences for bit-serial test-pattern generators is proposed. The proposed scheme achieves good fault coverage with low hardware overhead and short test sequences

Keywords

automatic test pattern generation; digital arithmetic; accumulator-based serial TPG; arithmetic BIST; arithmetic-function modules; bit-serial test-pattern generator; built-in self-test; compact test responses; maximum-length sequences; nonlinear sequences; nonlinear test pattern generation; short test sequence; test patterns generation; Adders; Arithmetic; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Degradation; Hardware; System testing; Test pattern generators; Arithmetic BIST; built-in self-test (BIST); nonlinear test pattern generation (TPG);

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2006.870860

Filename

1715441