DocumentCode
798253
Title
Improvements in electrostatic discharge performance of InGaAsP semiconductor lasers by facet passivation
Author
DeChiaro, Louis F. ; Sandroff, Claude J.
Author_Institution
Bellcore, Red Bank, NJ, USA
Volume
39
Issue
3
fYear
1992
fDate
3/1/1992 12:00:00 AM
Firstpage
561
Lastpage
565
Abstract
Chemically treating laser facets with aqueous sulfides can significantly improve the electrostatic discharge (ESD) performance of InGaAsP semiconductor lasers. Commercial lasers free of internal defects were subjected to forward-biased Human Body Model ESD stress pulses. Devices passivated with sulfides exhibited a mean ESD failure voltage more than 400% higher than that of the untreated control group. Subsequent accelerated aging experiments suggest that a thick layer of oxide covering the laser facets, largely removed by the sulfide treatment, is responsible for the low ESD failure voltage on untreated devices. This suggests that sulfide passivation followed by facet encapsulation in a robust dielectric could result in permanent protection against ESD failure
Keywords
III-V semiconductors; aluminium compounds; electrostatic discharge; encapsulation; gallium arsenide; gallium compounds; indium compounds; passivation; semiconductor junction lasers; ESD; ESD failure voltage; ESD stress pulses; Human Body Model; InGaAsP semiconductor lasers; accelerated aging experiments; aqueous sulfides; aqueous sulphides; electrical overstress; electrostatic discharge performance; facet encapsulation; facet passivation; permanent protection; semiconductors; Accelerated aging; Biological system modeling; Chemical lasers; Electrostatic discharge; Humans; Internal stresses; Laser modes; Optical pulses; Semiconductor lasers; Voltage control;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.123478
Filename
123478
Link To Document