• DocumentCode
    79868
  • Title

    Characterization and Analysis of 1.3-μm InAs/InGaAs Self-Assembled Quantum Dot Lasers

  • Author

    Chongyang Liu ; Hong Wang ; Qianqian Meng

  • Author_Institution
    Temasek Labs., Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    13
  • Issue
    3
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    446
  • Lastpage
    451
  • Abstract
    High performance 1.3-μm GaAs-based InAs/InGaAs quantum dot (QD) lasers have been fabricated. The QD lasers have demonstrated low threshold current, high output power as well as high temperature operation. Temperature-dependent (20-100°C) and excitation power-dependent (12-700 mW) photoluminescence (PL) measurements have been carried out on the QD laser structures. Both ground state (GS) and excited state (ES) luminescence has been observed in the PL spectra as well as in the lasing spectra. Rate equations were used to interpret the PL behavior of the QD structures. High radiative recombination efficiency in the QD structure has been verified even at 100°C. The excitonic modal gain has been calculated and compared with the experimentally obtained modal gain value by the Hakki-Paoli method from the QD laser with good agreement.
  • Keywords
    III-V semiconductors; excited states; gallium arsenide; ground states; indium compounds; photoluminescence; quantum dot lasers; self-assembly; InAs-InGaAs; excitation power-dependent photoluminescence; excited state; excitonic modal gain; ground state; output power; power 12 mW to 700 mW; radiative recombination efficiency; rate equations; self-assembled quantum dot lasers; size 1.3 mum; temperature 20 degC to 100 degC; temperature-dependent photoluminescence; threshold current; Excitons; Laser excitation; Measurement by laser beam; Quantum dot lasers; Vertical cavity surface emitting lasers; Hakki–Paoli method; modal gain; photoluminescence (PL); quantum dot (QD) laser; rate equation; semiconductor laser;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2013.2288320
  • Filename
    6654352