Title :
A Non-Invasive Metamaterial Characterization System Using Synthetic Gaussian Aperture
Author :
Chung, Jae-Young ; Sertel, Kubilay ; Volakis, John L.
Author_Institution :
Electr. & Comput. Eng. Dept., Ohio State Univ., Columbus, OH, USA
fDate :
7/1/2009 12:00:00 AM
Abstract :
A new free-space measurement approach is presented to characterize radio frequency (RF) materials and metamaterials over a wide frequency range. In contrast to the traditional spot-focused horn pair system, the proposed technique generates a Gaussian beam with a tight spot, focused on a sample under test via a synthesis using individually measured responses. Therefore, difficulties in fabricating lenses for the conventional spot-focused horn pair are avoided altogether. In this paper, we validate the proposed technique by extracting the permittivity of a known dielectric slab, and subsequently proceed to characterize the transmission properties of metamaterial assembly. The proposed technique can be adapted for measurements in EM facilities using spherical or planar scanning capability.
Keywords :
metamaterials; microwave materials; microwave measurement; permittivity measurement; Gaussian beam; dielectric slab; free-space measurement; noninvasive metamaterial characterization system; permittivity; radio frequency materials; synthetic Gaussian aperture; Assembly; Dielectric measurements; Frequency measurement; Lenses; Metamaterials; Optical materials; Permittivity measurement; Radio frequency; Slabs; System testing; Free-space measurement; Gaussian beam; material characterization; metamaterial; synthetic aperture;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2009.2021923