DocumentCode
799749
Title
Acoustic material signature extension
Author
Weglein, R.D.
Volume
32
Issue
1
fYear
1996
fDate
1/4/1996 12:00:00 AM
Firstpage
30
Lastpage
31
Abstract
Measurements and an empirical equation are presented for Δz M, the maxima separation along the lens axis between the focal plane and the first AMS peaks in the metrology mode of the acoustic microscope. The new addition ΔzM extends the upper range of the AMS family to higher Rayleigh velocity materials at microwave frequencies
Keywords
Rayleigh waves; acoustic materials; acoustic microscopy; Rayleigh velocity; acoustic material signature; acoustic microscope; focal plane; metrology mode; microwave frequencies;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19960008
Filename
490710
Link To Document