Title :
155 Mb/s operation of a FET-SEED free-space switching network
Author :
McCormick, F.B. ; Lentine, A.L. ; Morrison, R.L. ; Sasian, J.M. ; Cloonan, T.J. ; Novotny, R.A. ; Beckman, M.G. ; Wojcik, M.J. ; Hinterlong, S.J. ; Buchholz, D.B.
Abstract :
The interconnection problems present in many high-performance digital systems may be alleviated through the use of surface normal optical interconnections using optoelectronic smart pixels. We present recent results of high-speed operation of a five-stage experimental free-space switching network using embedded control techniques for network control. The smart pixels consist of buffered GaAs FET logic with MQW SEED detectors and modulators. The system also incorporates external cavity lasers, bulk, micro, and diffractive optics, two-dimensional fiber bundles, and novel optomechanics. At 155 Mb/s, 77 of the 80 total pixels in the system and 31 of the 32 input fibers were functional. Two of the network paths have carried digital video at 105 Mb/s for over four months without readjustment. Error rate measurements on these paths have shown a short-term BER of 10/sup -10/.<>
Keywords :
SEEDs; field effect logic circuits; integrated optoelectronics; optical interconnections; photodetectors; semiconductor quantum wells; smart pixels; television networks; 155 Mbit/s; FET-SEED free-space switching network; GaAs; MQW SEED detectors; buffered GaAs FET logic; carried digital video; diffractive optics; embedded control techniques; error rate measurements; external cavity lasers; five-stage experimental free-space switching network; high-performance digital systems; high-speed operation; input fibers; interconnection problems; modulators; network control; network paths; optoelectronic smart pixels; optomechanics; short-term BER; surface normal optical interconnections; two-dimensional fiber bundles; Detectors; Digital systems; FETs; Fiber lasers; Gallium arsenide; Logic; Optical buffering; Optical interconnections; Quantum well devices; Smart pixels;
Journal_Title :
Photonics Technology Letters, IEEE