• DocumentCode
    800899
  • Title

    Drift Tube Techniques for Active Semiconductor Testing in the Electron Beam of the Field Emission 705 Flash X-Ray Machine

  • Author

    Alexander, D.R. ; Hoffland, A.H.

  • Volume
    18
  • Issue
    3
  • fYear
    1971
  • fDate
    6/1/1971 12:00:00 AM
  • Firstpage
    771
  • Lastpage
    773
  • Abstract
    An evacuated drift tube has been designed and fabricated which enables the experimentor to use the electron beam of a 2 MeV flash X-ray machine for active, low noise irradiations of semiconductor devices. This paper gives design details of the drift tube and indicates the dose levels available as a function of tube parameters.
  • Keywords
    Active noise reduction; Circuit testing; Collimators; Electron beams; Electron tubes; Noise level; Radiation effects; Semiconductor device noise; Semiconductor device testing; Semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1971.4326179
  • Filename
    4326179
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=800899