• DocumentCode
    80098
  • Title

    THz Hilbert-Transform Spectrum Analyzer Based on High- T_{c} Josephson Junction in Stirling Cryocooler

  • Author

    Divin, Yuriy ; Lyatti, Matvey ; Snezhko, Alexander ; Poppe, Ulrich ; Pavlovskiy, Valery

  • Author_Institution
    Forschungszentrum Julich GmbH, Julich, Germany
  • Volume
    23
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    1800204
  • Lastpage
    1800204
  • Abstract
    A demonstrator of a terahertz (THz) Hilbert-transform spectrum analyzer with subsecond scanning times and accuracy of the order of 10-3 has been developed. The spectrum analyzer is based on a high-Tc Josephson junction in a compact Stirling cryocooler. Operation of the spectrum analyzer has been critically considered in the THz range and sources of errors have been studied. The voltage and frequency scales of the analyzer have been calibrated with accuracy of 7 ·10-4 by Shapiro steps, induced on the I(V) curve of the junction by intensive monochromatic radiation. Dynamic errors of the analyzer have been minimized with scanning rates up to 4 THz/s. An instrumental function of the spectrum analyzer is of a Lorentz type with a spectral width of 1.5 GHz and free from any harmonic and subharmonic contributions with accuracy of around 10-3. Rapid and detailed characterization of the THz sources, based on frequency multiplication of microwave radiation, has been demonstrated with the developed spectrum analyzer. The developed spectrum analyzer will be effective in new demanding THz applications, where a combination of high speed and accuracy is required.
  • Keywords
    Hilbert transforms; Josephson effect; high-temperature superconductors; spectral analysers; superconducting junction devices; terahertz wave devices; terahertz wave spectra; Josephson junction; Shapiro steps; analyzer dynamic errors; analyzer frequency scale; analyzer voltage scale; compact Stirling cryocooler; error sources; frequency multiplication; instrumental function; intensive monochromatic radiation; junction I(V) curve; microwave radiation; rapid characterization; scanning rates; spectral width; spectrum analyzer operation; subharmonic contribution; subsecond scanning times; terahertz Hilbert-transform spectrum analyzer demonstrator; terahertz applications; terahertz sources; Accuracy; Detectors; Frequency measurement; Instruments; Josephson junctions; Junctions; Spectroscopy; Cryogenics; Josephson junctions; high temperature superconductors; spectral analysis; submillimeter wave technology;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2012.2230431
  • Filename
    6365238