DocumentCode
80098
Title
THz Hilbert-Transform Spectrum Analyzer Based on High-
Josephson Junction in Stirling Cryocooler
Author
Divin, Yuriy ; Lyatti, Matvey ; Snezhko, Alexander ; Poppe, Ulrich ; Pavlovskiy, Valery
Author_Institution
Forschungszentrum Julich GmbH, Julich, Germany
Volume
23
Issue
3
fYear
2013
fDate
Jun-13
Firstpage
1800204
Lastpage
1800204
Abstract
A demonstrator of a terahertz (THz) Hilbert-transform spectrum analyzer with subsecond scanning times and accuracy of the order of 10-3 has been developed. The spectrum analyzer is based on a high-Tc Josephson junction in a compact Stirling cryocooler. Operation of the spectrum analyzer has been critically considered in the THz range and sources of errors have been studied. The voltage and frequency scales of the analyzer have been calibrated with accuracy of 7 ·10-4 by Shapiro steps, induced on the I(V) curve of the junction by intensive monochromatic radiation. Dynamic errors of the analyzer have been minimized with scanning rates up to 4 THz/s. An instrumental function of the spectrum analyzer is of a Lorentz type with a spectral width of 1.5 GHz and free from any harmonic and subharmonic contributions with accuracy of around 10-3. Rapid and detailed characterization of the THz sources, based on frequency multiplication of microwave radiation, has been demonstrated with the developed spectrum analyzer. The developed spectrum analyzer will be effective in new demanding THz applications, where a combination of high speed and accuracy is required.
Keywords
Hilbert transforms; Josephson effect; high-temperature superconductors; spectral analysers; superconducting junction devices; terahertz wave devices; terahertz wave spectra; Josephson junction; Shapiro steps; analyzer dynamic errors; analyzer frequency scale; analyzer voltage scale; compact Stirling cryocooler; error sources; frequency multiplication; instrumental function; intensive monochromatic radiation; junction I(V) curve; microwave radiation; rapid characterization; scanning rates; spectral width; spectrum analyzer operation; subharmonic contribution; subsecond scanning times; terahertz Hilbert-transform spectrum analyzer demonstrator; terahertz applications; terahertz sources; Accuracy; Detectors; Frequency measurement; Instruments; Josephson junctions; Junctions; Spectroscopy; Cryogenics; Josephson junctions; high temperature superconductors; spectral analysis; submillimeter wave technology;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2012.2230431
Filename
6365238
Link To Document