• DocumentCode
    8011
  • Title

    Mode Mixity Dependence of Interfacial Fracture Toughness in Organic Electronic Structures

  • Author

    Tong, Tiffany M. ; Ting Tan ; Rahbar, Nima ; Soboyejo, Winston O.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., Princeton, NJ, USA
  • Volume
    14
  • Issue
    1
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    291
  • Lastpage
    299
  • Abstract
    This paper presents the results of a combined experimental and theoretical study of interfacial fracture in organic electronic structures. Interfacial fracture toughness is investigated as a function of mode mixity using Brazil disk specimens. The measured fracture toughness values are then compared with predictions determined from crack-tip shielding estimates and atomic force microscopy measurements of adhesion between layers that are relevant to organic electronic structures. The interfacial and layer fracture mechanics are elucidated before discussing the implications for the design of robust organic electronic structures.
  • Keywords
    adhesion; atomic force microscopy; cracks; fracture mechanics; fracture toughness; organic semiconductors; Brazil disk; atomic force microscopy; crack-tip shielding estimate; interfacial fracture toughness; layer adhesion; mode mixity dependence; organic electronic structures; robust organic electronic structure; Flexible electronic devices; Fracture mechanics; Light emitting diodes; Solar cells; Flexible electronic devices; fracture mechanics; interfacial adhesion; organic light-emitting devices; organic solar cells;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2013.2256788
  • Filename
    6494274