Analysis of mode quality factors and mode reflectivities for nanowire cavity by FDTD technique

Author

Wang, Miao-Qing ; Huang, Yong-Zhen ; Chen, Qin ; Cai, Zhi-Ping

Author_Institution

State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China

Volume

42

Issue

2

fYear

2006

Firstpage

146

Lastpage

151

Abstract

The mode frequency and the quality factor of nanowire cavities are calculated from the intensity spectrum obtained by the finite-difference time-domain (FDTD) technique and the Pade´ approximation. In a free-standing nanowire cavity with dielectric constant ε=6.0 and a length of 5 μm, quality factors of 130, 159, and 151 are obtained for the HE₁₁ modes with a wavelength around 375 nm, at cavity radius of 60, 75, and 90 nm, respectively. The corresponding quality factors reduce to 78, 94, and 86 for a nanowire cavity standing on a sapphire substrate with a refractive index of 1.8. The mode quality factors are also calculated for the TE₀₁ and TM₀₁ modes, and the mode reflectivities are calculated from the mode quality factors.

Keywords

Q-factor; finite difference time-domain analysis; laser modes; microcavity lasers; nanowires; permittivity; quantum well lasers; reflectivity; refractive index; semiconductor quantum wires; 375 nm; 5 mum; 60 nm; 75 nm; 90 nm; Al₂O₃; FDTD technique; HE₁₁ modes; Pade approximation; TE₀₁ mode; TM₀₁ mode; dielectric constant; intensity spectrum; mode frequency; mode quality factors; mode reflectivities; nanowire cavity; refractive index; sapphire substrate; Finite difference methods; Frequency conversion; Laser modes; Nonlinear optics; Optical reflection; Optical resonators; Q factor; Reflectivity; Substrates; Time domain analysis; Cavity resonators; FDTD methods; laser modes; nanowire cavity; quality factor; reflection coefficient;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/JQE.2005.861823

Filename

1580642