DocumentCode
801552
Title
A Sub-0.2
hr Bias Drift Micromechanical Silicon Gyroscope With Automatic CMOS Mode-Matching
Author
Sharma, Ajit ; Zaman, Mohammad Faisal ; Ayazi, Farrokh
Author_Institution
Georgia Inst. of Technol., Atlanta, GA
Volume
44
Issue
5
fYear
2009
fDate
5/1/2009 12:00:00 AM
Firstpage
1593
Lastpage
1608
Abstract
This paper describes a system architecture and CMOS implementation that leverages the inherently high mechanical quality factor (Q) of a MEMS gyroscope to improve performance. The proposed time domain scheme utilizes the often-ignored residual quadrature error in a gyroscope to achieve, and maintain, perfect mode-matching (i.e., ~ 0 Hz split between the high-Q drive and sense mode frequencies), as well as electronically control the sensor bandwidth. A CMOS IC and control algorithm have been interfaced with a 60 mum thick silicon mode-matched tuning fork gyroscope (M2-mathchar TFG) to implement an angular rate sensing microsystem with a bias drift of 0.16deg/hr. The proposed technique allows microsystem reconfigurability-the sensor can be operated in a conventional low-pass mode for larger bandwidth, or in matched mode for low-noise. The maximum achieved sensor Q is 36,000 and the bandwidth of the microsensor can be varied between 1 to 10 Hz by electronic control of the mechanical frequencies. The maximum scale factor of the gyroscope is 88 mV/deg/s . The 3 V IC is fabricated in a standard 0.6 mum CMOS process and consumes 6 mW of power with a die area of 2.25 mm2.
Keywords
CMOS integrated circuits; Q-factor; elemental semiconductors; gyroscopes; microsensors; mode matching; silicon; vibrations; CMOS IC; MEMS gyroscope; angular rate sensing microsystem; bias drift micromechanical silicon gyroscope; mechanical frequencies; mechanical quality factor; microsensor; microsystem; mode-matching; residual quadrature error; silicon mode-matched tuning fork gyroscope; time domain scheme; Bandwidth; CMOS image sensors; CMOS integrated circuits; Error correction; Frequency; Gyroscopes; Mechanical sensors; Micromechanical devices; Q factor; Thickness control; Bandwidth control; DAC; bias drift; capacitive interface circuit; effective quality factor; envelope detector; microgyroscope; mode-matching; sigma-delta; transimpedance; zero-rate output;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2009.2016996
Filename
4907312
Link To Document