Direct measurement of preisach diagram from microhystersis loops at various delay times

Author

Ye, L.X. ; Lee, J.M. ; Wu, Te-Ho

Author_Institution

Taiwan SPIN Res. Center, Nat. Yunlin Univ. of Sci. & Technol., Taiwan

Volume

42

Issue

2

fYear

2006

Firstpage

289

Lastpage

291

Abstract

We report a direct and practical method of characterizing interaction field utilizing microhysteresis loops within an element area at submicrometer scale (0.34 μm×0.34 μm), on perpendicular anisotropic magnetic thin film material. The magnetization reversal behaviors at submicrometer scale were observed with various applied delay times under a series of applied magnetic fields. Our studies provide evidence of the asymmetrical behavior of microhysterons due to the interaction field of nearby magnetic elements.

Keywords

magnetic fields; magnetic hysteresis; magnetic thin films; magnetisation reversal; perpendicular magnetic anisotropy; 0.34 micron; Preisach diagram; delay times; interaction field; magnetic elements; magnetic fields; magnetic thin film material; magnetization reversal; microhysterons; microhystersis loops; perpendicular anisotropic thin film; Coercive force; Delay effects; Magnetic domain walls; Magnetic field measurement; Magnetic fields; Magnetic films; Magnetic materials; Materials science and technology; Microscopy; Silicon; Coercivity; Preisach diagrams; interaction field; microhysteresis;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2005.854920

Filename

1580695