Title :
A 0.13
m CMOS Quad-Band GSM/GPRS/EDGE RF Transceiver Using a Low-Noise Fractional-N Frequency Synthesizer and Direct-Conversion A
Author :
Pei-Wei Chen ; Tser-Yu Lin ; Ling-Wei Ke ; Rickey Yu ; Ming-Da Tsai ; Chih-Wei Yeh ; Yi-Bin Lee ; Bosen Tzeng ; Yen-Horng Chen ; Sheng-Jui Huang ; Yu-Hsin Lin ; Guang-Kaai Dehng
Author_Institution :
MediaTek Inc., Hsinchu
fDate :
5/1/2009 12:00:00 AM
Abstract :
This paper presents a single-chip CMOS quad-band (850/900/1800/1900 MHz) RF transceiver for GSM/GPRS/EDGE applications which adopts a direct-conversion receiver, a direct-conversion transmitter and a fractional-N frequency synthesizer with a built-in DCXO. In the GSM mode, the transmitter delivers 4 dBm of output power with 1deg RMS phase error and the measured phase noise is -164.5 dBc/Hz at 20 MHz offset from a 914.8 MHz carrier. In the EDGE mode, the TX RMS EVM is 2.4% with a 0.5 dB gain step for the overall 36 dB dynamic range. The RX NF and IIP3 are 2.7 dB/-12 dBm for the low bands (850/900 MHz) and 3 dB/-11 dBm for the high bands (1800/1900 MHz). This transceiver is implemented in 0.13 mum CMOS technology and occupies 10.5 mm2. The device consumes 118 mA and 84 mA in TX and RX modes from 2.8 V, respectively and is housed in a 5 times 5 mm2 40-pin QFN package.
Keywords :
CMOS integrated circuits; cellular radio; frequency synthesizers; packet radio networks; transceivers; 0.13 mum CMOS quad-band GSM/GPRS/EDGE RF transceiver; RMS phase error; current 118 mA; current 84 mA; digitally-controlled crystal oscillator; direct-conversion receiver; direct-conversion transmitter; frequency 914.8 MHz; low-noise fractional-N frequency synthesizer; phase noise; voltage 2.8 V; CMOS technology; Frequency synthesizers; GSM; Ground penetrating radar; Noise measurement; Power generation; Power measurement; Radio frequency; Transceivers; Transmitters; CMOS; DC offset; DCXO; EDGE; GSM; IIP2; constant K$_{rm VCO}$; direct-conversion; low-noise fractional-N synthesizer; on-chip matching; quad-band; temperature-compensated;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2009.2015797