Title :
A critical note on histogram testing of data acquisition channels
Author :
Schoukens, Johans
Author_Institution :
Dept. ELEC, Vrije Univ., Brussels, Belgium
fDate :
8/1/1995 12:00:00 AM
Abstract :
Histogram testing is used to measure the transfer characteristic of a digitizer in order to quantify and to analyze its nonlinear behavior. In this paper it is shown that this method is very insensitive to the out-of-phase components of the digitizers´ response to a sine wave excitation. This can lead to an underestimate of the nonlinear behavior of the digitizer
Keywords :
analogue-digital conversion; data acquisition; electric distortion measurement; probability; signal processing; A/D conversion; data acquisition channels; digitizer; histogram testing; nonlinear behavior; out-of-phase components; simulation; sine wave excitation; transfer characteristic; Analog-digital conversion; Data acquisition; Distortion measurement; Frequency; Histograms; Impedance; Instruments; Kernel; Power harmonic filters; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
