DocumentCode
803258
Title
A critical note on histogram testing of data acquisition channels
Author
Schoukens, Johans
Author_Institution
Dept. ELEC, Vrije Univ., Brussels, Belgium
Volume
44
Issue
4
fYear
1995
fDate
8/1/1995 12:00:00 AM
Firstpage
860
Lastpage
863
Abstract
Histogram testing is used to measure the transfer characteristic of a digitizer in order to quantify and to analyze its nonlinear behavior. In this paper it is shown that this method is very insensitive to the out-of-phase components of the digitizers´ response to a sine wave excitation. This can lead to an underestimate of the nonlinear behavior of the digitizer
Keywords
analogue-digital conversion; data acquisition; electric distortion measurement; probability; signal processing; A/D conversion; data acquisition channels; digitizer; histogram testing; nonlinear behavior; out-of-phase components; simulation; sine wave excitation; transfer characteristic; Analog-digital conversion; Data acquisition; Distortion measurement; Frequency; Histograms; Impedance; Instruments; Kernel; Power harmonic filters; Testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.392871
Filename
392871
Link To Document