DocumentCode
803635
Title
A Fully Recurrent Neural Network-Based Model for Predicting Spectral Regrowth of 3G Handset Power Amplifiers With Memory Effects
Author
Luongvinh, Danh ; Kwon, Youngwoo
Author_Institution
Sch. of Electr. Eng., Seoul Nat. Univ.
Volume
16
Issue
11
fYear
2006
Firstpage
621
Lastpage
623
Abstract
Efficient and accurate behavioral models of power amplifiers (PAs) with memory effects are important for predicting the distortions generated by PAs in 3G handsets. Conventional recurrent neural network (RNN) has been applied for RF PAs, but its capability to model PAs with memory effects has not been investigated. In this letter, we propose a new fully RNN with Gamma tapped-delay lines suitable for modeling the dynamic behavior of 3G PAs with memory effects. After being trained with wideband code division multiple access (W-CDMA) (3GPP Uplink) signals, the proposed model is validated with not only W-CDMA but also high-speed downlink packet access (3GPP Uplink) signals with higher peak-to-average ratios (PARs), which demonstrates the generality of the model. The comparisons with previous RNN models show that the proposed model offers improved performance in predicting spectral regrowth by reducing errors by 1.7-4dB
Keywords
3G mobile communication; circuit analysis computing; code division multiple access; delay lines; mobile handsets; power amplifiers; recurrent neural nets; 3G handset power amplifiers; adjacent channel leakage ratio; behavioral modeling; high speed downlink packet access; memory effects; recurrent neural network; spectral regrowth prediction; Multiaccess communication; Peak to average power ratio; Power amplifiers; Power generation; Predictive models; Radio frequency; Radiofrequency amplifiers; Recurrent neural networks; Telephone sets; Wideband; Adjacent channel leakage ratio (ACLR); behavioral modeling; high-speed downlink packet access (HSDPA); memory effects; recurrent neural network (RNN);
fLanguage
English
Journal_Title
Microwave and Wireless Components Letters, IEEE
Publisher
ieee
ISSN
1531-1309
Type
jour
DOI
10.1109/LMWC.2006.884910
Filename
1717523
Link To Document