DocumentCode
804155
Title
Magnetoresistance in Ni-Fe/Cu Multilayers
Author
Sato, M. ; Ishio, S. ; Miyazaki, T.
Author_Institution
Tohoku University.
Volume
9
Issue
1
fYear
1994
Firstpage
44
Lastpage
48
Abstract
Ni80 Fe20 /Cu multilayer films were prepared on glass substrate by magnetron sputtering. The dependence of the magnetoresistance on the thickness of the Cu layer, the thickness of the Ni-Fe layer, the thickness of the buffer layers for Fe, Ni80 Fe20 and Cu, and the number of bilayers, was investigated. The MR ratio peaked at dCu = 10Ã
, where the MR ratio was about 20% at room temperature. When the thickness of the Ni80 Fe20 layer was varied, the MR ratio had a broad peak from dNi-Fe =15 to 30Ã
. The interlayer exchange interaction was evaluated as 3Ã10¿2 erg/cm2, irrespective of the thickness of the buffer layer. The MR ratio increased with the number of bilayers N, and reached saturation when the total film thickness was about 800 to 1000Ã
.
Keywords
Buffer layers; Elementary particle exchange interactions; Glass; Iron; Magnetic multilayers; Magnetoresistance; Saturation magnetization; Sputtering; Substrates; Temperature;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1994.4565792
Filename
4565792
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