• DocumentCode
    804205
  • Title

    The Meta-Pi network: building distributed knowledge representations for robust multisource pattern recognition

  • Author

    Hampshire, John B., II ; Waibel, Alex

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    14
  • Issue
    7
  • fYear
    1992
  • fDate
    7/1/1992 12:00:00 AM
  • Firstpage
    751
  • Lastpage
    769
  • Abstract
    The authors present the Meta-Pi network, a multinetwork connectionist classifier that forms distributed low-level knowledge representations for robust pattern recognition, given random feature vectors generated by multiple statistically distinct sources. They illustrate how the Meta-Pi paradigm implements an adaptive Bayesian maximum a posteriori classifier. They also demonstrate its performance in the context of multispeaker phoneme recognition in which the Meta-Pi superstructure combines speaker-dependent time-delay neural network (TDNN) modules to perform multispeaker /b,d,g/ phoneme recognition with speaker-dependent error rates of 2%. Finally, the authors apply the Meta-Pi architecture to a limited source-independent recognition task, illustrating its discrimination of a novel source. They demonstrate that it can adapt to the novel source (speaker), given five adaptation examples of each of the three phonemes
  • Keywords
    Bayes methods; knowledge representation; neural nets; speech recognition; statistical analysis; Meta-Pi network; adaptive Bayesian maximum a posteriori classifier; distributed knowledge representations; multinetwork connectionist classifier; multisource pattern recognition; multispeaker phoneme recognition; speaker-dependent time-delay neural network; speech recognition; Bayesian methods; Error analysis; Knowledge representation; Neural networks; Pattern recognition; Robustness; Signal processing; Speech recognition; Telephony; US Government;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.142911
  • Filename
    142911