• DocumentCode
    804422
  • Title

    Oscillations in V(z) curves of thin samples

  • Author

    Mutti, Paolo ; Briggs, Andrew ; Bowler, Dave

  • Author_Institution
    Dipartimento di Ingegneria Nucl., Politecnico di Milano, Italy
  • Volume
    42
  • Issue
    4
  • fYear
    1995
  • fDate
    7/1/1995 12:00:00 AM
  • Firstpage
    567
  • Lastpage
    570
  • Abstract
    The explanation of the oscillations appearing at large defocus in the V(z) curves of thin specimens is given for isotropic and cubic materials. Using a ray model it is shown that oscillations are generated by the interference of the normal ray with the shear ray reflected from the bottom surface along a symmetrical path to the lens. The model predicts that in isotropic materials oscillations arise at critical values of defocus, while in anisotropic solids the onset of the oscillations depends on the shape of the slowness surface. In particular, for cubic crystals cut along.<>
  • Keywords
    III-V semiconductors; acoustic microscopy; gallium arsenide; GaAs; GaAs[001] wafers; anisotropic solid; cubic crystals; defocus; interference; isotropic materials; lens; normal ray; oscillations; ray model; reflection; shear ray; slowness surface; thin samples; Anisotropic magnetoresistance; Crystalline materials; Crystals; Interference; Lenses; Optical materials; Predictive models; Semiconductor device modeling; Shape; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.393099
  • Filename
    393099