DocumentCode
804422
Title
Oscillations in V(z) curves of thin samples
Author
Mutti, Paolo ; Briggs, Andrew ; Bowler, Dave
Author_Institution
Dipartimento di Ingegneria Nucl., Politecnico di Milano, Italy
Volume
42
Issue
4
fYear
1995
fDate
7/1/1995 12:00:00 AM
Firstpage
567
Lastpage
570
Abstract
The explanation of the oscillations appearing at large defocus in the V(z) curves of thin specimens is given for isotropic and cubic materials. Using a ray model it is shown that oscillations are generated by the interference of the normal ray with the shear ray reflected from the bottom surface along a symmetrical path to the lens. The model predicts that in isotropic materials oscillations arise at critical values of defocus, while in anisotropic solids the onset of the oscillations depends on the shape of the slowness surface. In particular, for cubic crystals cut along.<>
Keywords
III-V semiconductors; acoustic microscopy; gallium arsenide; GaAs; GaAs[001] wafers; anisotropic solid; cubic crystals; defocus; interference; isotropic materials; lens; normal ray; oscillations; ray model; reflection; shear ray; slowness surface; thin samples; Anisotropic magnetoresistance; Crystalline materials; Crystals; Interference; Lenses; Optical materials; Predictive models; Semiconductor device modeling; Shape; Solid modeling;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.393099
Filename
393099
Link To Document