• DocumentCode
    80553
  • Title

    Analysis of Gated CMOS Image Sensor for Spatial Filtering

  • Author

    Spivak, Arthur ; Belenky, Alexander ; Fish, Alexander ; Yadid-Pecht, Orly

  • Author_Institution
    VLSI Syst. Center, Ben-Gurion Univ. of the Negev, Beersheba, Israel
  • Volume
    60
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan. 2013
  • Firstpage
    305
  • Lastpage
    313
  • Abstract
    Pulsed gated vision systems are essential tools in obtaining images in obscure environmental conditions. Contrary to the existing gated systems, which use intensifiers and other external equipment, we present a design of gated sensor, which is implemented in a CMOS process. The proposed sensor is capable to filter out the objects according to their distance to the camera. This ability enables to remove the undesired reflections and to see more clearly the target. Such gated vision principle is implemented using a unique multishuttering regime. Various properties of this regime such as charge-transfer mechanisms, frequency of switching, pulsewidth, slew rate, etc., are described and thoroughly analyzed. Upon the performed analysis, we optimize the shape of the shutter pulses and substantially reduce the charge-transfer time. A 128 × 256 CMOS gated image sensor was fabricated in 0.18-μm process and successfully tested. The included experimental results fully corroborate with the theory, showing the sensor functionality and proving the feasibility of the proposed design.
  • Keywords
    CMOS image sensors; cameras; image intensifiers; integrated optoelectronics; spatial filters; camera; charge-transfer mechanism; external equipment; gated CMOS image sensor; intensifier; multishuttering regime; pulsed gated vision system; size 0.18 mum; spatial filtering; CMOS integrated circuits; Capacitance; Charge transfer; Logic gates; Shape; Switches; Transistors; Active-pixel sensor; CMOS image sensors; charge transfer; gating; global shutter; sensor;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2226726
  • Filename
    6365291