DocumentCode :
806646
Title :
Properties of Ion-Implanted Silicon Detectors
Author :
Zulliger, H.R. ; Drummond, W.E. ; Middleman, L.M.
Author_Institution :
Nuclear Semiconductor a Division of United Scientific Corporation Menlo Park, California 94025
Volume :
19
Issue :
3
fYear :
1972
fDate :
6/1/1972 12:00:00 AM
Firstpage :
306
Lastpage :
311
Keywords :
Alpha particles; Aluminum; Boron; Energy loss; Energy measurement; Loss measurement; Particle measurements; Radiation detectors; Silicon; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1972.4326742
Filename :
4326742
Link To Document :
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