• DocumentCode
    807351
  • Title

    Analytical Techniques for the Determination of Equipment Probability of Survival to Radiation Stress

  • Author

    Young, L.S. ; Vassallo, F.A. ; Kleiner, C.T.

  • Author_Institution
    North American Rockwell Electronics Group Anaheim, California 92803
  • Volume
    19
  • Issue
    6
  • fYear
    1972
  • Firstpage
    108
  • Lastpage
    114
  • Abstract
    Two analytical techniques (Monte Carlo and Small Sample Theory) are described which have been used to produce a survivability function, PS(RS), for equipment subject to a radiation stress, RS. The methods have been used for permanent damage due to neutron fluence and transient upset due to ionizing radiation. The methods are illustrated using a series regulator circuit. The techniques are sufficiently general such that they are applicable to a variety of environmental stresses.
  • Keywords
    Area measurement; Assembly; Character generation; Circuits; Ionizing radiation; Neutrons; Stress; Systems engineering and theory; Testing; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1972.4326817
  • Filename
    4326817