• DocumentCode
    807446
  • Title

    Absolute Yields of X-Ray Induced Photoemission from Metals

  • Author

    Bradford, John N.

  • Author_Institution
    Air Force Cambridge Research Laboratories (AFSC) L. G. Hanscom Field, Bedford, Mass. 01730
  • Volume
    19
  • Issue
    6
  • fYear
    1972
  • Firstpage
    167
  • Lastpage
    171
  • Abstract
    Absolute electron yields from tantalum, molybdenum, copper and aluminum have been measured for several x-ray bombarding geometries. The photon spectra used were derived from filtered bremsstrahlung generated in a tungsten anode at 50 KV, constant potential. The electron spectra were measured by a cylindrical electrostatic analyzer with a secondary emission detector. The spectra exhibit both Auger and scattered photoelectrons.
  • Keywords
    Aluminum; Anodes; Copper; Detectors; Electron emission; Electrostatic analysis; Electrostatic measurements; Geometry; Photoelectricity; Tungsten;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1972.4326827
  • Filename
    4326827