DocumentCode

807753

Title

Current Crowding in Hardened Power Transistors

Author

Clark, L.E. ; George, W.L.

Author_Institution

Motorola Semiconductor Products Division Phoenix, Arizona

Volume

19

Issue

6

fYear

1972

Firstpage

344

Lastpage

346

Keywords

Conductivity; Degradation; Impurities; Microwave transistors; Neutrons; Power transistors; Proximity effect; Resistors; Threshold current; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1972.4326856

Filename

4326856