• DocumentCode
    807965
  • Title

    Correction of errors owing to thermal elongation of high temperature coaxial probe for microwave permittivity measurement

  • Author

    Arai, M. ; Binner, J.G.P. ; Cross, T.E.

  • Author_Institution
    Dept. of Mater. Eng. & Mater. Design, Nottingham Univ., UK
  • Volume
    31
  • Issue
    14
  • fYear
    1995
  • fDate
    7/6/1995 12:00:00 AM
  • Firstpage
    1138
  • Lastpage
    1139
  • Abstract
    A method for correcting errors owing to the thermal elongation of high temperature coaxial probe for microwave permittivity measurement has been developed. The method has been verified by measuring the open circuit permittivity of the probe which operates up to 1200°C
  • Keywords
    high-temperature techniques; measurement errors; microwave measurement; permittivity measurement; 1200 C; dielectric measurement; high temperature coaxial probe; measurement error correction; microwave permittivity measurement; open circuit permittivity; thermal elongation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950780
  • Filename
    398581
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=807965