• DocumentCode
    808164
  • Title

    Co-based superstructured nitride alloy films: characteristics and applications for high frequency heads

  • Author

    Kaminaka, N. ; Sakakima, H. ; Takahashi, K. ; Osano, K. ; Hasegawa, H.

  • Author_Institution
    Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
  • Volume
    26
  • Issue
    6
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    2936
  • Lastpage
    2941
  • Abstract
    Co-based superstructured films composed of 25-nm-thick non-nitride and nitride layers were prepared by N2 reactive RF sputtering. The films have high 4πMs=13 kG, a high permeability μ=3000, and a high thermal stability of the magnetic properties. Magnetic heads composed of laminated superstructured films insulated with SiO2 films were developed for high-frequency operations. The heads show excellent recording capability for narrow gap recording with metal tapes and high reproduction characteristics at frequencies over 10 MHz. They achieve an increase of more than 4 dB in normalized output when compared with conventional laminated-type amorphous film heads. The superstructured nitride film heads are expected to be used in next-generation VCRs, which operate with higher density recording and wider frequency bands
  • Keywords
    cobalt alloys; magnetic heads; magnetic permeability; magnetic recording; magnetic thin film devices; niobium alloys; sputtered coatings; zirconium alloys; 10 MHz; 25 nm; Co-based superstructured nitride alloy films; CoNbZr-CoNbZrN; N2 reactive RF sputtering; SiO2; SiO2 films; VCR; high frequency heads; high permeability; high thermal stability; higher density recording; laminated superstructured films; magnetic properties; metal tapes; narrow gap recording; recording capability; wider frequency bands; Amorphous materials; Insulation; Magnetic films; Magnetic heads; Magnetic properties; Magnetic recording; Permeability; Radio frequency; Sputtering; Thermal stability;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.102869
  • Filename
    102869