• DocumentCode
    808283
  • Title

    50 Ω noise measurements with full receiver calibration without tuner

  • Author

    Crozat, P. ; Boutez, C. ; Chaubet, M. ; Danelon, V. ; Sylvestre, A. ; Vernet, G.

  • Author_Institution
    Inst. d´´Electron. Fondamentale, Univ. de Paris-Sud, Orsay, France
  • Volume
    32
  • Issue
    3
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    261
  • Lastpage
    262
  • Abstract
    A 50 Ω high frequency noise measurement has been developed. A new approach for calculating the four noise parameters is presented. This method necessitates no isolator and has broadband capacities. Receiver calibration and F50 HEMT measurements are presented
  • Keywords
    calibration; electric noise measurement; high electron mobility transistors; semiconductor device noise; semiconductor device testing; HEMT measurements; HF noise measurements; broadband capacities; full receiver calibration; high frequency noise;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960146
  • Filename
    490840
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=808283