• DocumentCode
    808337
  • Title

    Application of anodic oxidation for postgrowth tailoring of InGaAsP/InP asymmetric Fabry-Perot modulator reflection spectra

  • Author

    Timofeev, F.N. ; Seeds, A.J. ; Bayvel, P. ; Midwinter, J.E. ; Hopkinson, M.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. Coll. London, UK
  • Volume
    31
  • Issue
    14
  • fYear
    1995
  • fDate
    7/6/1995 12:00:00 AM
  • Firstpage
    1186
  • Lastpage
    1187
  • Abstract
    Reflection spectrum tuning of InGaAsP/InP asymmetric Fabry-Perot modulators (AFPMs) using anodic oxidation followed by anodic oxide removal is reported for the first time. 30-40 nm tuning of the reflection spectra of double and single Bragg stack mirror AFPM structures with better than λ/100 accuracy has been achieved
  • Keywords
    Fabry-Perot resonators; III-V semiconductors; anodisation; gallium arsenide; indium compounds; integrated optics; optical modulation; reflectivity; Bragg stack mirror AFPM structures; InGaAsP-InP; InGaAsP/InP asymmetric Fabry-Perot modulator; anodic oxidation; postgrowth tailoring; reflection spectrum tuning;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950810
  • Filename
    398615