Title :
Compact antenna test range reflector edge treatment
Author :
Parini, C.G. ; Philippakis, M.
Author_Institution :
Dept. of Electron. Eng., Queen Mary & Westfield Coll., London, UK
fDate :
1/18/1996 12:00:00 AM
Abstract :
The physical optics technique is used to compare the performance of single offset compact antenna test ranges with different reflector edge treatments and rim shapes. A comparison between reflector edge taper and rim serrations in controlling edge diffraction is demonstrated
Keywords :
antenna testing; electromagnetic wave diffraction; microwave antennas; offset reflector antennas; physical optics; compact antenna test range; edge diffraction control; physical optics technique; reflector edge taper; reflector edge treatment; rim serrations; rim shapes;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960074
