The comparison between FVM and FEM for EIT forward problem

Author

Dong, Guoya ; Zou, J. ; Bayford, Richard H. ; Ma, Xinshan ; Gao, Shangkai ; Yan, Weili ; Ge, Manling

Author_Institution

Province-Minist. Joint Key Lab. of Electromagn. Field & Electr. Apparatus Reliability, Hebei Univ. of Technol., Tianjin, China

Volume

41

Issue

5

fYear

2005

fDate

5/1/2005 12:00:00 AM

Firstpage

1468

Lastpage

1471

Abstract

In this paper, the finite volume method (FVM) is introduced in detail for solving the electrical impedance tomography (EIT) forward problem. A new idea for constructing the primary and secondary elements in FVM is presented. Detailed comparisons between FVM and the finite element method (FEM), including the characteristic of the coefficient matrix and the precision of the results, are carried out under the same mesh system. It is shown that accurate estimates of the potential distribution can be obtained with an FVM solution.

Keywords

electric impedance imaging; finite element analysis; finite volume methods; EIT forward problem; coefficient matrix; electrical impedance tomography; finite element method; finite volume method; Bioelectric phenomena; Conductivity; Electric potential; Finite element methods; Finite volume methods; Image reconstruction; Integral equations; Surface impedance; Surface reconstruction; Tomography; Electrical impedance tomography (EIT); finite element method (FEM); finite volume method (FVM); forward problem;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2005.844558

Filename

1430886