• DocumentCode
    808935
  • Title

    A comprehensive explanation of distortion sideband asymmetries

  • Author

    De Carvalho, Nuno Borges ; Pedro, José Carlos

  • Author_Institution
    Instituto de Telecomunicacoes, Aveiro Univ., Portugal
  • Volume
    50
  • Issue
    9
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    2090
  • Lastpage
    2101
  • Abstract
    This paper presents a comprehensive study of intermodulation-distortion response asymmetries often observed in microwave nonlinear systems subject to a two-tone or multitone test. The reasons for the different amplitudes of the two adjacent tones are first investigated under small- and large-signal regimes, using a general circuit with frequency-dependent embedding impedances and resistive and reactive nonlinearities. It is shown that this intriguing phenomenon can be mainly attributed to the terminating impedances at the baseband or difference frequencies. Multitone behavior is also addressed and its main differences from the two-tone case explained. Those theoretical conclusions are then extrapolated for real circuits and validated by measured results obtained from microwave power amplifiers of two different technologies, i.e., a GaAs MESFET and an Si bipolar junction transistor
  • Keywords
    intermodulation distortion; microwave measurement; microwave power amplifiers; nonlinear systems; semiconductor device testing; MESFET; bipolar junction transistor; distortion sideband asymmetries; frequency-dependent embedding impedances; intermodulation-distortion response asymmetries; large-signal regimes; microwave nonlinear systems; microwave power amplifiers; multitone test; reactive nonlinearities; resistive nonlinearities; small-signal regimes; terminating impedances; two-tone test; Baseband; Circuit testing; Frequency; Impedance; Microwave circuits; Microwave measurements; Nonlinear distortion; Nonlinear systems; Power measurement; System testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2002.802321
  • Filename
    1028948