• DocumentCode
    808953
  • Title

    Simulation of the effect of energetic ion radiation on silicon

  • Author

    McGarrah ; Williamson, W., Jr. ; Keeton, S.C.

  • Author_Institution
    Sandia Nat. Lab., Livermore, CA, USA
  • Volume
    39
  • Issue
    5
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    1401
  • Lastpage
    1406
  • Abstract
    A set of programs under development to simulate the three-dimensional interaction of high energy ions with solid silicon is described. A classical trajectory Monte Carlo algorithm was used to model the initial ion strike to the target and the primary ionization of electrons produced in the target. The number of primary electrons, along with their position and momenta, were entered as input into a non-relativistic Monte Carlo electron transport code. Both elastic and inelastic scattering events were considered in the simulation of the secondary electron cascade. Inelastic collisions include ionization of all shells. A prediction is made of the quantity and radius of the plume of space charge generated within the semiconductor material due to the cosmic ray ion strike
  • Keywords
    Monte Carlo methods; ion beam effects; silicon; Monte Carlo electron transport code; Si; classical trajectory Monte Carlo algorithm; cosmic ray ion strike; high energy ions; inelastic scattering events; ionization; primary electrons; primary ionization; secondary electron cascade; semiconductor material; space charge; three-dimensional interaction; Discrete event simulation; Electrons; Ion radiation effects; Ionization; Monte Carlo methods; Scattering; Silicon; Solid modeling; Space charge; Trajectory;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.173214
  • Filename
    173214