Title :
Frequency- and intensity-noise measurements of a widely tunable 2-μm Tm-Ho:KYF laser
Author :
Galzerano, Gianluca ; Sani, Elisa ; Toncelli, Alessandra ; Tonelli, Mauro ; Svelto, Cesare ; Laporta, Paolo
Author_Institution :
Dipt. di Fisica, Politecnico di Milano, Milan, Italy
Abstract :
The measurement of the frequency and intensity noise in a novel single-mode 2-μm Tm-Ho:KYF laser is presented. The laser frequency noise is measured by exploiting the fringe side of the transmission of a Fabry-Pe´rot interferometer. The measured power spectral density of the frequency noise is principally characterized by a random-walk noise contribution, which sets an emission linewidth of ∼ 600 kHz for the 2-μm radiation. The relative intensity noise (RIN) reaches the quantum limit of -155 dB/Hz for Fourier frequencies above 1 MHz and shows a maximum level of -90 dB/Hz at the relaxation-oscillation frequency of 20 kHz.
Keywords :
Fabry-Perot interferometers; holmium; intensity measurement; laser cavity resonators; laser noise; laser tuning; laser variables measurement; noise measurement; potassium compounds; solid lasers; thulium; ytterbium compounds; 2 micron; 20 kHz; Fabry-Perot interferometer; KYF4:Tm,Ho; diode-pumped laser; intensity noise measurement; laser frequency noise measurement; power spectral density; random-walk noise contribution; relative intensity noise; relaxation-oscillation frequency; single-mode Tm-Ho:KYF laser; solid-state laser; tunable laser; Crystalline materials; Frequency measurement; Laser excitation; Laser noise; Laser tuning; Mirrors; Noise measurement; Pump lasers; Solid lasers; Tunable circuits and devices; Diode-pumped laser; frequency-noise measurement; intensity-noise measurement; solid-state laser; tunable laser;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.861261
