DocumentCode
809601
Title
Single-photon avalanche diode arrays for fast transients and adaptive optics
Author
Zappa, Franco ; Tisa, Simone ; Cova, Sergio ; Maccagnani, Piera ; Calia, Domenico Bonaccini ; Saletti, Roberto ; Roncella, Roberto ; Bonanno, Giovanni ; Belluso, Massimiliano
Author_Institution
Dipt. di Elettronica, Politecnico di Milano, Italy
Volume
55
Issue
1
fYear
2006
Firstpage
365
Lastpage
374
Abstract
An instrumentation based on a silicon monolithic array of 60 photon counters [single-photon avalanche diode array (SPADA)] for state-of-the-art measurements of fast transient phenomena and adaptive optics (AO) is presented. The fabricated solid-state photon counters are rugged, easy to be integrated in the optical system, free from read-out noise, and provide very fast frame rates (> 10 kHz) and nanosecond electronic gating. The detection electronics includes an integrated active-quenching circuit (AQC) for each pixel of the array. The real-time data-processing board is implemented into a field programmable gate array (FPGA) and a digital signal processor (DSP) and is configurable for dealing with different applications: acquisition and processing of two-dimensional (2-D) images with fast frame rate and extraction of the curvature wavefront for adaptive optics applications. The optical and electrical characterization of the detectors and the associated electronics is reported.
Keywords
adaptive optics; avalanche photodiodes; image sensors; particle detectors; photodetectors; photon counting; wavefront sensors; 2D images; active-quenching circuit; adaptive optics; array detector; detection electronics; digital signal processor; electrical characterization; fast transient phenomena; field programmable gate array; image acquisition; image processing; nanosecond electronic gating; optical characterization; photon timing; single-photon avalanche diode; solid-state photon counters; state-of-the-art measurements; Adaptive arrays; Adaptive optics; Counting circuits; Diodes; Field programmable gate arrays; Instruments; Optical arrays; Optical noise; Silicon; Solid state circuits; Adaptive optics; Geiger; array detector; fast transient phenomena; photon counting; photon timing; single-photon avalanche diode (SPAD);
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2005.861503
Filename
1583902
Link To Document